Andrej Rumiantsev (Director of RF Technologies- Advanced Semiconductor Test Division) MPI Corporation, presenting at Interlligent UK's 2024 RF Design Seminar.
Traceability of S-parameters to fundamental SI units is crucial for accurately assessing uncertainties in microwave measurements across the industry. S-parameters are the foundation for defining microwave product specifications. Understanding the sources and minimizing uncertainties of measured S-parameters is crucial for confident cross-team collaboration during the product development phase and the final product positioning on the market.
For over 30 years, engineers and metrologists have worked to establish a robust traceability chain for wafer-level system calibration and measurements. This presentation reviewed recent progress in understanding, quantifying, and propagating uncertainties through the wafer-level mm-wave calibration and measurement process. It shared examples of establishing the traceability for corrected S-parameters. It also provided recommendations on how to reduce calibration and measurement uncertainties, relevant for both wafer-level and connectorized environment.
The topic and the methods discussed are appealing to professionals involved in developing next-generation semiconductor processes and mm-wave ICs.