TITLE: The program for nanoscale structure, kinetics and dynamics at APS-U Feature beamline 9-ID, a new home for grazing incidence x-ray scattering from soft matter interfaces
ABSTRACT: Development of the APS-U Feature Beamline CSSI (Coherent Surface Scattering Imaging) at 9-ID will provide a new home and new capabilities for the program in nanoscale structure and kinetics and the grazing Incidence x-ray scattering (GIXS) instrument migrating from 8-ID-E. The APS-U source, a revolver undulator and horizontally deflecting double crystal monochromator will provide highly coherent x-rays tunable over the range from 6-25 keV. Two transfocators can focus the beam to ~ 3 um spot size at the sample. The GIXS diffractometer and infrastructure from 8-ID-E will provide robust, stable sample positioning of horizontally oriented samples with a variety of environments. An in-air area detector mounted on a detector positioning system will capture wide-angle scattering from the sample. A large vacuum flight path allows for distances 3-20 m from the sample to a state-of-the-art in-vacuum pixel array detector for small-angle scattering as well as grazing-incidence x-ray photon correlation spectroscopy (GI-XPCS) to capture the dynamics of thin film materials spanning time scales from 10-3 to 103 seconds. Complementing these hardware developments, high performance computing and open-source software will combine for automated workflows to help users keep up with the accelerated pace of data acquisition. Highlights from the legacy of the GIXS instrument at 8-ID-E, including scattering studies of organic electronics, mixed ionic-electronic conductors and hybrid organic-inorganic materials and devices, will illustrate the vibrancy of the user science program and point the way forward as the program expands at 9-ID to include GI-XPCS and nanoscale dynamics.