Welcome back to our lecture series on Rietveld Refinement! In this second installment, we explore the essential concepts of crystal structure and their impact on X-ray diffraction patterns.
In this video, we cover:
✅ The lattice and basis as fundamental components of crystal structure
✅ Miller indices and their role in identifying crystallographic planes
✅ The reciprocal lattice and its connection to diffraction
✅ The structure factor and how it influences diffraction intensities
Understanding these concepts is crucial for performing Rietveld refinement, where we refine structural models to fit experimental diffraction data.
Stay tuned for Part 3, where we will discuss powder diffraction principles and data acquisition!
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